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Digital Systems Testing & Testable Design by Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

Digital Systems Testing & Testable Design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman ebook
Page: 653
Publisher:
ISBN: 0780310624, 9780780310629
Format: pdf

Digital Systems Testing and Testable Design. In hardware, the signature is usually formed sequentially bit by bit with the aid of a linear feedback shift register (LFSR). BREUER, University ofSouthern California, Los AngelesARTHUR D. Digital Systems Testing and Testable Design – Miron Abramovici, Melvin A. Labels: DIGITAL, digital books, TESTING and VERIFICATION. Digital Systems Testing & Testable Design. This course is an introduction to the field of digital systems testing, which is an integral part of IC design and manufacturing. Digital Systems Testing and Testable Design, New York, IEEE Press, 1990. Digital Systems Testing & Testable Design by Miron Abramovici, Melvin A. DIGITAL SYSTEMS TESTINGANDTESTABLE DESIGNRevised PrintingMIRON ABRAMOVICI, AT&T Bell Laboratories, Murra.v HillMELVIN A. Friedman- John Wiley & Sons Inc. The topics discussed are: Importance of VLSI Testing, Test process and Automatic Test Equipment, Defects versus Fault models, Fault simulation, Logic simulation, Combinational Circuit Testing, Sequential Circuit Testing, Memory Testing, Design-for-Testability, Scan Design, Boundary Scan, Built-in-Self Test, Delay Test, Current Testing, VLSI Reliability, etc.